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NanoWorld ARROW™ SILICON AFM PROBES
Optimized positioning through maximized tip visibility
Our Arrow™ series features standard AFM tips for contact, non-contact and force modulation mode that have a tetrahedral tip.
The unique Arrow™ shape of the cantilever allows easy positioning of the tip on the area of interest.
Furthermore the Arrow™ series also includes a range of tipless cantilevers and cantilever arrays.
NanoWorld™ is a leading manufacturer of innovative high quality probes for Atomic Force Microscopy (AFM) and Scanning Probe Microscopy (SPM). The many kinds of SPM probes with various tip shapes and coatings offered by NanoWorld™ are used by researchers as well as in industrial applications.